Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography Journal Article


Author(s): Rastelli, Armando; Stoffel, Mathieu; Malachias, Ângelo S; Merdzhanova, Tsvetelina; Katsaros, Georgios; Kern, Klaus; Metzger, Till H; Schmidt, Oliver G
Article Title: Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography
Affiliation
Abstract: Scanning probe microscopy; Semiconductor quantum dots; Composition gradients; Composition profiles; Nanotomography; Single quantum dots; Strained sige/si; Three-dimensional (3D); Wet-chemical etchings; X-ray scattering measurements; quantum dot; methodology; nanotechnology; optical tomography; scanning probe microscopy; three dimensional imaging; Imaging, Three-Dimensional; Materials Testing; Microscopy, Scanning Probe; Nanotechnology; Quantum Dots; Tomography,
Journal Title: Nano Letters
Volume: 8
Issue 5
ISSN: 1530-6992
Publisher: American Chemical Society  
Date Published: 2008-05-01
Start Page: 1404
End Page: 1409
Sponsor: This work was supported by the BMBF (No. 03N8711) and the EU project D-DotFET (No. 012150)
DOI: 10.1021/nl080290y
Open access: no